Browsing by author "Tyaginov, S."

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A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs

Sharma, P.; Tyaginov, S.; Rauch, S.E.; Franco, Jacopo; Kaczer, Ben; Makarov, A.; Vexler, M.I.; Grasser, T. (2016)
Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets

Bury, Erik; Vaisman Chasin, Adrian; Kaczer, Ben; Vandemaele, M.; Tyaginov, S.; Franco, Jacopo; Ritzenthaler, Romain; Mertens, Hans; Weckx, Pieter; Horiguchi, Naoto; Linten, Dimitri (2022)