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Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets
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Authors
Bury, Erik
;
Vaisman Chasin, Adrian
;
Kaczer, Ben
;
Vandemaele, M.
;
Tyaginov, S.
;
Franco, Jacopo
;
Ritzenthaler, Romain
;
Mertens, Hans
;
Weckx, Pieter
;
Horiguchi, Naoto
;
Linten, Dimitri
DOI
10.1109/IRPS48227.2022.9764526
EISBN
978-1-6654-7950-9
ISSN
1541-7026
Conference
IEEE International Reliability Physics Symposium (IRPS)
Journal
na
Title
Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets
Publication type
Proceedings paper
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Date
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2
20.500.12860/41179.2
*
2023-06-01T12:34:46Z
validation by library/open access desk
1
20.500.12860/41179
2023-02-27T03:28:35Z
*Selected version
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