Publication:

Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets

Date

2022

Proceedings Paper

https://doi.org/10.1109/IRPS48227.2022.9764526

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Author(s)

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Vaisman Chasin, Adrian

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Ritzenthaler, Romain

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Horiguchi, Naoto

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Linten, Dimitri

Journal

na

Statistics

1316 since deposited on 2023-02-27

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Acq. date: 2026-04-05