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Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets
Publication:
Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets
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Date
2022
Proceedings Paper
https://doi.org/10.1109/IRPS48227.2022.9764526
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bury, Erik
;
Vaisman Chasin, Adrian
;
Kaczer, Ben
;
Vandemaele, M.
;
Tyaginov, S.
;
Franco, Jacopo
;
Ritzenthaler, Romain
;
Mertens, Hans
;
Weckx, Pieter
;
Horiguchi, Naoto
;
Linten, Dimitri
Journal
na
Abstract
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Acq. date: 2026-01-06
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Views
1315
since deposited on 2023-02-27
3
last month
2
last week
Acq. date: 2026-01-06
Citations