Browsing by author "Nafría, M."
Now showing items 1-3 of 3
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Channel hot-carrier degradation under static stress in short channel transistors with high-k/metal gate stacks
Amat, E.; Kauerauf, Thomas; Degraeve, Robin; De Keersgieter, An; Rodríguez, R.; Nafría, M.; Aymerich, X.; Groeseneken, Guido (2008) -
Critical metrology for ultrathin high k dielectrics
Vandervorst, Wilfried; Brijs, Bert; Bender, Hugo; Conard, Thierry; Petry, Jasmine; Richard, Olivier; Blasco, X.; Nafría, M. (2003) -
Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Maji, D.; Crupi, Felice; Amat, E.; Simoen, Eddy; De Jaeger, Brice; Brunco, David; Manoj, C.R.; Ramgopal Rao, V.; Magnone, P.; Giusi, G.; Pace, C.; Pantisano, Luigi; Mitard, Jerome; Rodríguez, R.; Nafría, M. (2009)