Publication:
Channel hot-carrier degradation under static stress in short channel transistors with high-k/metal gate stacks
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1891 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-18
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Statistics
Views
1891 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-18
Citations