Publication:
Channel hot-carrier degradation under static stress in short channel transistors with high-k/metal gate stacks
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1884 since deposited on 2021-10-17
3last month
Acq. date: 2026-01-12
Citations
Metrics
Views
1884 since deposited on 2021-10-17
3last month
Acq. date: 2026-01-12
Citations