Publication:
Channel hot-carrier degradation under static stress in short channel transistors with high-k/metal gate stacks
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1888 since deposited on 2021-10-17
4last month
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Acq. date: 2026-02-24
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Statistics
Views
1888 since deposited on 2021-10-17
4last month
2last week
Acq. date: 2026-02-24
Citations