Browsing by author "Vandewalle, N."
Now showing items 1-4 of 4
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Analysis of the gate voltage fluctuations in ultra-thin gate oxides after soft breakdown
Houssa, Michel; Vandewalle, N.; Nigam, Tanya; Ausloos, M.; Mertens, Paul; Heyns, Marc (1998) -
Non-Gaussian behavior and anticorrelations in ultrathin gate oxides after soft breakdown
Vandewalle, N.; Ausloos, M.; Houssa, Michel; Mertens, Paul; Heyns, Marc (1999) -
Technology and reliability aspects of ultra-thin silicon dioxide layers
Heyns, Marc; Nigam, Tanya; Degraeve, Robin; Mertens, Paul; Schaekers, Marc; Bearda, Twan; De Gendt, Stefan; Groeseneken, Guido; Maes, Herman; Claes, Martine; Houssa, Michel; Vandewalle, N.; Ausloos, M. (1999) -
Technology and reliability of sub-3nm oxides
Heyns, Marc; Nigam, Tanya; Degraeve, Robin; Mertens, Paul; Schaekers, Marc; De Gendt, Stefan; Groeseneken, Guido; Maes, Herman; Houssa, Michel; Vandewalle, N.; Ausloos, M. (1999)