Browsing by author "Wagner, Paul-Jurgen"
Now showing items 1-10 of 10
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A rigorous study of measurement techniques for negative bias temperature instability
Grasser, Tibor; Wagner, Paul-Jurgen; Hehenberger, Philipp; Gos, Wolfgang; Kaczer, Ben (2007-10) -
Analytic modeling of the bias temperature instability using capture/emission time maps
Grasser, Tibor; Wagner, Paul-Jurgen; Reisinger, Hans; Aichinger, T.; Pobegen, G.; Nelhiebel, M.; Kaczer, Ben (2011-12) -
On the frequency dependence of the bias temperature instability
Grasser, Tibor; Kaczer, Ben; Reisinger, Hans; Wagner, Paul-Jurgen; Toledano Luque, Maria (2012) -
Oxide traps in MOS transistors: semi-automatic extraction of trap parameters from time dependent defect spectroscopy
Wagner, Paul-Jurgen; Grasser, Tibor; Reisinger, Hans; Kaczer, Ben (2010-07) -
Recent advances in understanding the bias temperature instability
Grasser, Tibor; Kaczer, Ben; Goes, Wolfgang; Reisinger, Hans; Aichinger, Thomas; Hehenberger, Phillip; Wagner, Paul-Jurgen; Schanovsky, Franz; Franco, Jacopo; Roussel, Philippe; Nelhiebel, M (2010-12) -
Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise
Grasser, Tibor; Reisinger, Hans; Goes, Wolfgang; Aichinger, Thomas; Hehenberger, Phillip; Wagner, Paul-Jurgen; Nelheibel, M.; Franco, Jacopo; Kaczer, Ben (2009) -
The "permanent" component of NBTI: composition and annealing
Grasser, Tibor; Aichinger, Thomas; Pobegen, Gregor; Reisinger, Hans; Wagner, Paul-Jurgen; Franco, Jacopo; Nelhiebel, M.; Kaczer, Ben (2011-04) -
The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
Grasser, Tibor; Kaczer, Ben; Goes, Wolfgang; Reisinger, Hans; Aichinger, Thomas; Hehenberger, Phillip; Wagner, Paul-Jurgen; Schanovsky, Franz; Franco, Jacopo; Toledano Luque, Maria; Nelhiebel, M (2011) -
The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability
Grasser, Tibor; Reisinger, Hans; Wagner, Paul-Jurgen; Schanovsky, Franz; Goes, Wolfgang; Kaczer, Ben (2010-05) -
Time-dependent defect spectroscopy for characterization of border traps in metal-oxide-semiconductor transistors
Grasser, Tibor; Reisinger, Hans; Wagner, Paul-Jurgen; Kaczer, Ben (2010-12)