Browsing by imec author "27f433580d95ab7ba77856cbb06212d91cf777f0"
Now showing items 21-40 of 69
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IMEC and DHV cooperation for the sustainable treatment of HF wastewater with a crystalactor
Van Bavel, Mieke; Van den Broeck, Kristel; Van Hoornick, Nausikaa; Van Hoeymissen, Jan; de Boer, Robert (2003) -
Influence of oxygen and carbon on the generation and annihilation of radiation defects in silicon
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Stesmans, Andre; Clauws, P. (1996) -
Interactive C-code cleaning tool supports multiprocessor SoC design
Van Bavel, Mieke; Tilman, Michel (2008-07) -
Interactive C-code cleaning tool supports multiprocessor SoC design
Van Bavel, Mieke; Tilman, Michel (2008) -
Interactive C-code cleaning tool supports multiprocessor SoC design
Van Bavel, Mieke; Tilman, Michel (2008-07) -
Interactive C-code cleaning tool supports multiprocessor SoC design
Van Bavel, Mieke; Tilman, Michel (2008-07) -
Ion beam synthesis of buried CoxNi1-xSi2 layers in silicon
Wu, Ming Fang; De Wachter, Jo; Van Bavel, Mieke; Pattyn, H.; Langouche, G.; Vanhellemont, Jan; Bender, Hugo; Temst, K.; Bruynseraede, Y. (1994) -
Ion beam synthesis of buried CoxNi1-xSi2 layers in silicon
Wu, Ming Fang; De Wachter, Jo; Van Bavel, Mieke; Pattyn, H.; Langouche, G.; Vanhellemont, Jan; Bender, Hugo; Temst, K.; Wuyts, Bart; Bruynseraede, Y. (1994) -
Key to efficient photocurrent generation
Van Bavel, Mieke; Aernouts, Tom (2010) -
Körperwärme: Energiequelle der Zukunft
Van Bavel, Mieke (2005-12) -
Kupfer-zu-Kupfer Wire-Bonding erfordert eine Anpassung des Bondprozesses - Massnahmen gegen die Oxidationsgefahr
Van Bavel, Mieke; Degryse, Dominiek; Stoukatch, Serguei; Vandevelde, Bart; Beyne, Eric (2004-04) -
La via verso la commercializzazione
Van Bavel, Mieke; Aernouts, Tom (2010-11) -
Lithography for sub-90nm applications
Van den hove, Luc; Goethals, Mieke; Ronse, Kurt; Van Bavel, Mieke; Vandenberghe, Geert (2002) -
Low Temperature Anneal of Electron Irradiation Induced Defects in p-Type Silicon
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1994) -
Low temperature anneal of electron irradiation induced defects in p-type silicon
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1998) -
Low temperature anneal of the divacancy in p-type silicon
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Stesmans, Andre; Clauws, P. (1995) -
Low Temperature Anneal of the Divacancy in p-Type Silicon
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1994) -
Low-k dielectrics: spin-on or CVD?
Van Bavel, Mieke; Iacopi, Francesca; Baklanov, Mikhaïl; Maex, Karen (2004) -
Low-k1 imaging for contacts and lines using immersion ArF
Van Bavel, Mieke; Hendrickx, Eric; Wiaux, Vincent; Vandenberghe, Geert (2005-02) -
Low-temperature anneal of the divacancy in p-type silicon: a transformation from V2 to VxOy complexes
Trauwaert, Marie-Astrid; Vanhellemont, Jan; Maes, Herman; Van Bavel, Mieke; Langouche, G.; Clauws, P. (1995)