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Low Temperature Anneal of Electron Irradiation Induced Defects in p-Type Silicon
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Authors
Trauwaert, Marie-Astrid
;
Vanhellemont, Jan
;
Maes, Herman
;
Van Bavel, Mieke
;
Langouche, G.
;
Clauws, P.
Conference
1st International Conference on Materials for Microelectronics; October 17-19, 1994; Barcelona, Spain.
Title
Low Temperature Anneal of Electron Irradiation Induced Defects in p-Type Silicon
Publication type
Oral presentation
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