Browsing by author "Smeys, Peter"
Now showing items 1-6 of 6
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Influence of process-induced stress on device characteristics and its impact on scaled device performance
Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1999) -
Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications
Simoen, Eddy; Magnusson, Ulf; Van den Bosch, Geert; Smeys, Peter; Colinge, Jean-Pierre; Claeys, Cor (1994) -
The influence of oxidation-induced stress on the generation current and its impact on scaled device performance
Smeys, Peter; Griffin, P. B.; Rek, Z. U.; De Wolf, Ingrid; Saraswat, K. C. (1996) -
The low-frequency noise overshoot in partially depleted N-channel silicon-on-insulator TWIN MOSTs
Simoen, Eddy; Smeys, Peter; Claeys, Cor (1994) -
Transmission electron diffraction techniques for nm scale strain measurement in semiconductors
Vanhellemont, Jan; Janssens, Koenraad; Frabboni, S.; Smeys, Peter; Balboni, R.; Armigliato, A. (1996) -
Transmission electron diffraction techniques for nm scale strain measurements in semiconductors
Vanhellemont, Jan; Janssens, Koenraad; Frabboni, S.; Smeys, Peter; Balboni, R.; Armigliato, A. (1996)