Browsing by author "Pergoot, A."
Now showing items 1-4 of 4
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A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (2001) -
A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (1999) -
Modelling hot carrier degradation of LDD NMOSFETs by using a high resolution measurement technique
Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (1999) -
The influence of addition elements on the early resistance changes observed during electromigration testing of Al metal lines
De Ceuninck, Ward; D'Haeger, V.; Van Olmen, Jan; Witvrouw, Ann; Maex, Karen; De Schepper, Luc; De Pauw, P.; Pergoot, A. (1998)