Publication:
A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
Date
Loading...
Journal
Abstract
Description
Metrics
Views
2002 since deposited on 2021-10-14
444item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
2002 since deposited on 2021-10-14
444item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations