Publication:
A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
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2004 since deposited on 2021-10-14
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Acq. date: 2026-01-11
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2004 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-01-11
Citations