A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation

Publication:

2001

Journal article

Author(s)

;

;

;

;

;

;

Microelectronics Reliability

2011 since deposited on 2021-10-14

3last month

1last week

Acq. date: 2026-08-06