Publication:
A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
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2074 since deposited on 2021-10-06
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Acq. date: 2025-10-24
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Views
2074 since deposited on 2021-10-06
435item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations