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A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Publication:
A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Dreesen, R.
;
Croes, Kris
;
Manca, Jean
;
De Ceuninck, Ward
;
De Schepper, Luc
;
Pergoot, A.
;
Groeseneken, Guido
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2074
since deposited on 2021-10-06
Acq. date: 2025-10-24
Citations
Metrics
Views
2074
since deposited on 2021-10-06
Acq. date: 2025-10-24
Citations