Publication:
A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
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2081 since deposited on 2021-10-06
2last month
Acq. date: 2026-01-09
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Metrics
Views
2081 since deposited on 2021-10-06
2last month
Acq. date: 2026-01-09
Citations