Publication:
A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
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2079 since deposited on 2021-10-06
3last month
Acq. date: 2025-12-08
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Metrics
Views
2079 since deposited on 2021-10-06
3last month
Acq. date: 2025-12-08
Citations