Browsing by author "Bonaldo, S."

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Low-frequency Noise and Defects in Copper and Ruthenium Resistors

Fleetwood, Dan; Beyne, Sofie; jiang, Rong; Zhao, S. E.; Whang, P.; Bonaldo, S.; McCurdy, M. W.; Tokei, Zsolt; De Wolf, Ingrid; Croes, Kristof; Zhang, E. X.; Alles, M. S.; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri (2019)
Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors

Gorchichko, Maria; Zhang, E.X.; Wang, P.; Schrimpf, R.; Reed, R.; Fleetwood, D.M.; Bonaldo, S.; Linten, Dimitri; Mitard, Jerome (2020)