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Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
Publication:
Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
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Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gorchichko, Maria
;
Zhang, E.X.
;
Wang, P.
;
Schrimpf, R.
;
Reed, R.
;
Fleetwood, D.M.
;
Bonaldo, S.
;
Linten, Dimitri
;
Mitard, Jerome
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1971
since deposited on 2021-10-28
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last month
Acq. date: 2025-12-10
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Metrics
Views
1971
since deposited on 2021-10-28
1
last month
Acq. date: 2025-12-10
Citations