Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors

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Authors
Gorchichko, Maria; Zhang, E.X.; Wang, P.; Schrimpf, R.; Reed, R.; Fleetwood, D.M.; Bonaldo, S.; Linten, Dimitri; Mitard, Jerome
Conference
Nuclear & Space Radiation Effects Conference - NSREC
Title
Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
Publication type
Proceedings paper
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