Publication:
Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors
Date
| dc.contributor.author | Gorchichko, Maria | |
| dc.contributor.author | Zhang, E.X. | |
| dc.contributor.author | Wang, P. | |
| dc.contributor.author | Schrimpf, R. | |
| dc.contributor.author | Reed, R. | |
| dc.contributor.author | Fleetwood, D.M. | |
| dc.contributor.author | Bonaldo, S. | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.date.accessioned | 2021-10-28T22:03:17Z | |
| dc.date.available | 2021-10-28T22:03:17Z | |
| dc.date.issued | 2020 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35192 | |
| dc.identifier.url | http://www.nsrec.com/2020_session-c.html | |
| dc.source.beginpage | C-4 | |
| dc.source.conference | Nuclear & Space Radiation Effects Conference - NSREC | |
| dc.source.conferencedate | 20/07/2020 | |
| dc.source.conferencelocation | Santa Fe USA | |
| dc.title | Total-ionizing-dose response of hghly-scaled gate-all-around Si nanowire CMOS transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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