Low-frequency Noise and Defects in Copper and Ruthenium Resistors

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Authors

Fleetwood, Dan; Beyne, Sofie; jiang, Rong; Zhao, S. E.; Whang, P.; Bonaldo, S.; McCurdy, M. W.; Tokei, Zsolt; De Wolf, Ingrid; Croes, Kristof; Zhang, E. X.; Alles, M. S.; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri

ISSN

0003-6951

Issue

20

Journal

Applied Physics Letters

Volume

114

Title

Low-frequency Noise and Defects in Copper and Ruthenium Resistors

Publication type

Journal article

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