Low-frequency Noise and Defects in Copper and Ruthenium Resistors

Fleetwood, Dan; Beyne, Sofie; jiang, Rong; Zhao, S. E.; Whang, P.; Bonaldo, S.; McCurdy, M. W.; Tokei, Zsolt; De Wolf, Ingrid; Croes, Kristof; Zhang, E. X.; Alles, M. S.; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri

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Low-frequency Noise and Defects in Copper and Ruthenium Resistors

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2019

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Applied Physics Letters

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1948 since deposited on 2021-10-27

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Acq. date: 2026-08-04

Low-frequency Noise and Defects in Copper and Ruthenium Resistors

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