Browsing by author "Radhakrishnan, M.K."
Now showing items 1-3 of 3
-
A new breakdown failure mechanism in HfO2 gate dielectrics
Ranjan, R.; Pey, K.L.; Tang, L.J.; Tung, C.H.; Groeseneken, Guido; Radhakrishnan, M.K.; Kaczer, Ben; Degraeve, Robin; De Gendt, Stefan (2004) -
ESD reliability challenges for RF/mixed signal design and processing
Mahadeva Iyer, Natarajan; Radhakrishnan, M.K. (2003) -
Physical failure analysis to distinguish EOS and ESD failures
Tung, Chih Hang; Cheng, Cheng Kou; Radhakrishnan, M.K.; Mahadeva Iyer, Natarajan (2002)