Browsing by author "Bayerl, Albin"

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Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach

Wu, Qian; Porti, Marc; Bayerl, Albin; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, Xavier; Simoen, Eddy (2015)
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors

Bayerl, Albin; Lanza, Mario; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier; De Gendt, Stefan (2013)