Browsing by author "El-Sayed, A."

Now showing items 1-2 of 2

Gate-sided hydrogen release as the origin of "permanent" NBTI degradation: from single defects to lifetimes

Grasser, Tibor; Waltl, Michael; Wimmer, Yannick; Goes, Wolfgang; Kosik, R.; Rzepa, Gerhard; Resinger, Hans; Pobegen, Gregor; El-Sayed, A.; Shluger, A.; Kaczer, Ben (2015)
Physics-based modeling of hot-carrier degradation in Ge NWFETs

Tyaginov, Stanislav; Vaisman Chasin, Adrian; Makarov, A.; El-Sayed, A.; Jech, M.; De Keersgieter, An; Eneman, Geert; Vandemaele, Michiel; Franco, Jacopo; Linten, Dimitri; Kaczer, Ben (2019)