Browsing by author "Raskin, Geoffroy"
Now showing items 1-4 of 4
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Germanium deep-submicron pFET and nFET devices with etched TaN metal gate and high-k dielectric, fabricated on germanium-on-insulator substrates
Meuris, Marc; De Jaeger, Brice; Van Steenbergen, Jan; Letertre, Fabrice; Raskin, Geoffroy; Billon, Thierry; Heyns, Marc (2005) -
Towards 100μm thin, flexible germanium wafers for photovoltaic applications
Geens, Wim; Dessein, Kristof; Posthuma, Niels; Flamand, Giovanni; Raskin, Geoffroy; Vercammen, Hans; De Meulemeester, Bendix; Quaeyhaegens, Carl; Mijlemans, Paul; Köstler, W.; Strobl, G.; Sharps, P.; Taylor, Stephen (2004) -
VPD-DC-TXRF for metallic contamination analysis of Ge wafers
Hellin, David; Geens, Veerle; Teerlinck, Ivo; Van Steenbergen, Jan; Raskin, Geoffroy; Mertens, Paul; De Gendt, Stefan; Vinckier, Chris (2004) -
VPD-DC-TXRF for metallic contamination analysis of Ge wafers
Hellin, David; Geens, V.; Teerlinck, Ivo; Van Steenbergen, Jan; Rip, Jens; Laureyn, Wim; Raskin, Geoffroy; Mertens, Paul; De Gendt, Stefan; Vinckier, Chris (2005)