Browsing by author "Kis-Szabo, Krisztian"

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Contactless mobility measurements of inversion charge carriers on silicon substrates with SiO2 and HfO2 gate dielectrics

Everaert, Jean-Luc; Rosseel, Erik; Dekoster, Johan; Pap, Aron; Maszaros, Albert; Kis-Szabo, Krisztian; Pavelka, Tibor (2010)
Novel noncontact approach to characterization of mobility in inversion layers using corona charging of dielectric and SPV monitoring of sheet resistance

Everaert, Jean-Luc; Rosseel, Erik; Meszaros, Albert; Kis-Szabo, Krisztian; Tutto, P; Pap, Aron; Pavelka, Tibor; Wilson, Marshall; Findlay, Andrew; Edelman, P.; Lagowski, Jacek (2010)