Browsing by author "Arstila, Kai"
Now showing items 1-20 of 56
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An optical force measurement system with microfabricated mirror probes and in-plane tips for semiconductor device characterization
Hantschel, Thomas; Arstila, Kai (2010) -
Analysis of nanoparticles with elastic recoil detection
Arstila, Kai; Brijs, Bert; Giangrandi, Simone; Hantschel, Thomas; Vandervorst, Wilfried (2009) -
ARIBA: a combined analysis set-up for high resolution RBS and TOF-ERDA for thin film analysis
Sajavaara, Timo; Brijs, Bert; Giangrandi, Simone; Arstila, Kai; Vantomme, Andre; Vandervorst, Wilfried (2004) -
Automated control of the nanoprober system for nanoscale electrical measurements
Arstila, Kai; Hantschel, Thomas; Nuytten, Thomas (2013) -
Carbon nanotube growth for through-silicon via applications
Xie, Rongsie; Zhang, Can; van der Veen, Marleen; Arstila, Kai; Hantschel, Thomas; Chen, Bingan; Zhong, Guofang; Robertson, John (2013) -
Composition quantification of microelectronics multilayer thin films by EDX: toward small scale analysis
Conard, Thierry; Arstila, Kai; Hantschel, Thomas; Franquet, Alexis; Vandervorst, Wilfried; Vecchio, Emma; Bauer, Frank; Burgess, Simon (2009) -
Compressively strained SiGe band-to-band tunneling model calibration based on p-i-n diodes and prospects of strained SiGe tunneling field-effect transistors
Kao, Frank; Verhulst, Anne; Rooyackers, Rita; Douhard, Bastien; Delmotte, Joris; Bender, Hugo; Richard, Olivier; Vandervorst, Wilfried; Simoen, Eddy; Hikavyy, Andriy; Loo, Roger; Arstila, Kai; Collaert, Nadine; Thean, Aaron; Heyns, Marc; De Meyer, Kristin (2014) -
Considerations about multiple and plural scattering in heavy-ion low-energy ERDA
Giangrandi, Simone; Arstila, Kai; Brijs, Bert; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2009) -
Depth resolution optimization and role of multiple scattering in low-energy TOF-ERDA
Giangrandi, Simone; Brijs, Bert; Arstila, Kai; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Depth resolution optimization for low-energy ERDA
Giangrandi, Simone; Arstila, Kai; Brijs, Bert; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Detection of failure sites by focused ion beam and nano-probing in the interconnect of three-dimensional stacked circuit structures
Yang, Yu; Bender, Hugo; Arstila, Kai; Swinnen, Bart; Verlinden, Bert; De Wolf, Ingrid (2008) -
Development of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technology
Hantschel, Thomas; Cott, Daire; Palanne, Saku; Richard, Olivier; Arstila, Kai; Verhulst, Anne; Schulz, Volker; Eyben, Pierre; Vandervorst, Wilfried (2008) -
Diamond nano-particle seeding for tip moulding application
Tsigkourakos, Menelaos; Hantschel, Thomas; Arstila, Kai; Vandervorst, Wilfried (2013) -
Diamond nano-particle seeding on three-dimensional geometries for tip moulding application
Tsigkourakos, Menelaos; Hantschel, Thomas; Arstila, Kai; Vandervorst, Wilfried (2012) -
Diamond tip based automated two-point electrical probing on the nanoscale
Hantschel, Thomas; Arstila, Kai; Olanterae, Lauri; Vandervorst, Wilfried (2010) -
Diamond tips for automated electrical probing inside a scanning electron microscopy system
Hantschel, Thomas; Arstila, Kai; Olantera, Lauri; Schulze, Andreas; Werner, Thilo; Eyben, Pierre; Clarysse, Trudo; Vandervorst, Wilfried (2011) -
Diamond tips for electrical probing on the nanometer scale
Hantschel, Thomas; Arstila, Kai; Schulze, Andreas; Eyben, Pierre; Tsigkourakos, Menelaos; Vandervorst, Wilfried (2011) -
Effect of boron doping on the wear behavior of the growth and nucleation surfaces of micro- and nanocrystalline diamond films
Buijnsters, Josephus G.; Tsigkourakos, Menelaos; Hantschel, Thomas; Gomes, Oliver; Nuytten, Thomas; Favia, Paola; Bender, Hugo; Arstila, Kai; Celis, Jean-Pierre; Vandervorst, Wilfried (2016) -
Effects of interfacial strength and dimension of structures on physical cleaning window
Kim, Tae-Gon; Pacco, Antoine; Wostyn, Kurt; Xu, XiuMei; Struyf, Herbert; Arstila, Kai; Park, Jin-Goo; De Gendt, Stefan; Mertens, Paul; Heyns, Marc (2010) -
Electrical resistivity and contact resistance in carbon nanotube vertical interconnects
Chiodarelli, Nicolo; Li, Yunlong; Arstila, Kai; Richard, Olivier; Cott, Daire; Heyns, Marc; De Gendt, Stefan; Groeseneken, Guido; Vereecken, Philippe (2010)