Browsing by author "Lafonteese, David"
Now showing items 1-12 of 12
-
Analysis of high voltage ESD protection devices under HBM ESD stress
Linten, Dimitri; Vashchenko, Vlad; Scholz, Mirko; Jansen, Philippe; Lafonteese, David; Thijs, Steven; Sawada,; Hasebe,; Hopper, Peter; Groeseneken, Guido (2008-05) -
Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress
Linten, Dimitri; Vashchenko, Vlad; Scholz, Mirko; Jansen, Philippe; Lafonteese, David; Thijs, Steven; Sawada,; Hasebe,; Hopper, Peter; Groeseneken, Guido (2008-09) -
HBM ESD robustness of GaN-on-Si Schottky diodes
Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, Antonio; Lafonteese, David; Concannon, Ann; Vashchenko, Vlad; Hopper, Peter; Bychikhin, Sergei; Pogany, Dionyz; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2011) -
HBM ESD robustness of GaN-on-Si Schottky diodes for power applications
Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Vashchenko, Vladislav; Gallerano, Antonio; Lafonteese, David; Hopper, Peter; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2011) -
HBM parameter extraction and transient safe operating area
Linten, Dimitri; Thijs, Steven; Griffoni, Alessio; Scholz, Mirko; Chen, Shih-Hung; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010-10) -
Improving the of ESD self-protection capability of Integrated power NLDMOS arrays
Vashchenko, V.; Strachan, A.; Linten, Dimitri; Lafonteese, David; Concannon, Ann; Scholz, Mirko; Thijs, Steven; Jansen, Philippe; Hopper, Peter; Groeseneken, Guido (2010) -
Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester
Scholz, Mirko; Chen, Shih-Hung; Linten, Dimitri; Johnsson, David; Gallerano, Antonio; Lafonteese, David; Concannon, Ann; Vandersteen, Gerd; Sawada, Masanori; Groeseneken, Guido (2012) -
On-wafer human metal model measurements for system-level ESD analysis
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Nakaei, T.; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, P.; Groeseneken, Guido (2009-09) -
On-wafer human metal model measurements for system-level ESD analysis on component level
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Griffoni, Alessio; Sawada, Masanori; Nakaei, T; Hasebe, Takumi; Lafonteese, David; Vashchenko, Vladislav; Vandersteen, Gerd; Hopper, Peter; Meneghesso, Gaudenzio; Groeseneken, Guido (2009-10) -
SCCF - System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Griffoni, Alessio; Russ, Christian; Stadler, Wolfgang; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010) -
Self-protection capability of integrated power arrays
Vashchenko, Vladislav; Scholz, Mirko; Linten, Dimitri; Lafonteese, David; Thijs, Steven; Jansen, Philippe; Hopper, Peter; Groeseneken, Guido (2010) -
Self-protection capability of power arrays
Lafonteese, David; Vashchenko, Vladislav; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Sawada, Masanori; Nakaei, T; Hasebe, Takumi; Hopper, Peter; Groeseneken, Guido (2009-09)