Browsing by author "Ghica, C."
Now showing items 1-4 of 4
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Imaging of H2 bubbles and the related strain field in silicon wafers exposed to RF hydrogen plasma
Ghica, C.; Nistor, L.; Richard, Olivier; Bender, Hugo; Ulyashin, Aliaksandr; Van Tendeloo, G. (2004) -
In situ transmission electron microscopy study of the silicidation process in Co thin films on patterned (001) Si substrates
Ghica, C.; Nistor, Leona; Bender, Hugo; Steegen, An; Lauwers, A.; Maex, Karen; Van Landuyt, J. (2001) -
Quantitative description of the strain field around {111} planar defects in hydrogenated silicon wafers
Ghica, C.; Nistor, L.C.; Richard, Olivier; Bender, Hugo; Ulyashin, Aliaksandr; Van Tendeloo, G. (2004) -
TEM characterization of extended defects induced in Si wafers by H-plasma treatment
Ghica, C.; Nistor, L.C.; Bender, Hugo; Richard, Olivier; Van Tendeloo, G.; Ulyashin, A. (2007-01)