Browsing by author "Wortman, J. J."
Now showing items 1-3 of 3
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A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides
Yang, N.; Henson, W. K.; Wortman, J. J. (2000) -
Analysis of tunneling currents and reliability of NMOSFET's with sub-2 nm gate oxides
Yang, N.; Henson, W. K.; Wortman, J. J. (1999) -
Observation of oxide breakdown and its effects on the characteristics of ultra-thin-oxide nMOSFETs
Henson, W. K.; Yang, N.; Wortman, J. J. (1999)