Browsing by author "Kuper, F. G."
Now showing items 1-3 of 3
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Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Verhaege, Koen; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Gieser, H.; Russ, Christian; Egger, P.; Guggenmos, X.; Kuper, F. G. (1994) -
Fast transient ESD simulation of the NMOS protection transistor
Luchies, J. R. M.; Verhaege, Koen; Kuper, F. G.; de Graaff, H. C. (1995) -
Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Verhaege, Koen; Russ, Christian; Luchies, J. M.; Groeseneken, Guido; Kuper, F. G. (1997)