Browsing by author "Pace, Calogero"
Now showing items 1-3 of 3
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Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise
Magnone, Paolo; Crupi, Felice; Pantisano, Luigi; Pace, Calogero (2007-02) -
Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices
Magnone, Paolo; Subramanian, Vaidy; Parvais, Bertrand; Mercha, Abdelkarim; Pace, Calogero; Dehan, Morin; Decoutere, Stefaan; Groeseneken, Guido; Crupi, Felice; Pierro, Silvio (2008) -
On the impact of defects close to the gate electrode on the low-frequency 1/f noise
Magnone, Paolo; Pantisano, Luigi; Crupi, Felice; Trojman, Lionel; Pace, Calogero; Giusi, Gino (2008-09)