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Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise
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Authors
Magnone, Paolo
;
Crupi, Felice
;
Pantisano, Luigi
;
Pace, Calogero
Issue
7
Journal
Applied Physics Letters
Volume
90
Title
Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise
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Journal article
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