On the impact of defects close to the gate electrode on the low-frequency 1/f noise

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Authors
Magnone, Paolo; Pantisano, Luigi; Crupi, Felice; Trojman, Lionel; Pace, Calogero; Giusi, Gino
Journal
IEEE Electron Devices Letters
Volume
29
Title
On the impact of defects close to the gate electrode on the low-frequency 1/f noise
Publication type
Journal article
Embargo date
9999-12-31
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