Publication:
On the impact of defects close to the gate electrode on the low-frequency 1/f noise
Date
| dc.contributor.author | Magnone, Paolo | |
| dc.contributor.author | Pantisano, Luigi | |
| dc.contributor.author | Crupi, Felice | |
| dc.contributor.author | Trojman, Lionel | |
| dc.contributor.author | Pace, Calogero | |
| dc.contributor.author | Giusi, Gino | |
| dc.date.accessioned | 2021-10-17T08:42:13Z | |
| dc.date.available | 2021-10-17T08:42:13Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2008-09 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14100 | |
| dc.source.beginpage | 1056 | |
| dc.source.endpage | 1058 | |
| dc.source.journal | IEEE Electron Devices Letters | |
| dc.source.volume | 29 | |
| dc.title | On the impact of defects close to the gate electrode on the low-frequency 1/f noise | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |