Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
On the impact of defects close to the gate electrode on the low-frequency 1/f noise
Publication:
On the impact of defects close to the gate electrode on the low-frequency 1/f noise
Date
2008-09
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
16825.pdf
216.32 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Magnone, Paolo
;
Pantisano, Luigi
;
Crupi, Felice
;
Trojman, Lionel
;
Pace, Calogero
;
Giusi, Gino
Journal
IEEE Electron Devices Letters
Abstract
Description
Metrics
Views
1978
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1978
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations