Browsing by author "Hayama, K."
Now showing items 41-48 of 48
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Radiation damage of InGaAs photodiodes by high-temperature electron and neutron irradiation
Ohyama, H.; Takakura, K.; Hayama, K.; Simoen, Eddy; Claeys, Cor; Toshio, H. (2003) -
Radiation damage of MOSFETs by high-temperature electron irradiation
Ohyama, H.; Hayama, K.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2002) -
Radiation damages in STI diodes after high temperature electron-irradiation
Ohyama, H.; Hayama, K.; Takakura, K.; Miura, T.; Simoen, Eddy; Poyai, Amporn; Takami, Y.; Claeys, Cor (2002) -
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs
Hayama, K.; Takakura, T.; Ohyama, H.; Kuboyama, S.; Matsuda, S.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Radiation source dependence on floating-body effect in thin gate oxide fully-depleted SOI N-MOSFETs
Hayama, K.; Ohyama, H.; Takakura, K.; Kuboyama, S.; Jono, T.; Oka, K.; Matsuda, S.; Simoen, Eddy; Claeys, Cor (2004) -
Radiation tolerance in HfSiON gate MOSFETs by high-energy Particles irradation
Hayama, K.; Takakura, K.; Nishimura, A.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Recovery behaviour resulting from thermal annealing in n-MOSFETs irradiated by 20MeV protons
Takakura, K.; Ohyama, H.; Ueda, A.; Nakabayashi, M.; Hayama, K.; Kobayashi, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Short-channel radiation effect in 60 MeV proton irradiated 0.13 μm CMOS transistors
Simoen, Eddy; Mercha, Abdelkarim; Morata, Alex; Hayama, K.; Richardson, Geoffrey; Rafi, Joan Marc; Augendre, Emmanuel; Claeys, Cor; Mohammadzadeh, A.; Ohyama, H.; Romano-Rodriguez, A. (2003)