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Recovery behaviour resulting from thermal annealing in n-MOSFETs irradiated by 20MeV protons
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Authors
Takakura, K.
;
Ohyama, H.
;
Ueda, A.
;
Nakabayashi, M.
;
Hayama, K.
;
Kobayashi, K.
;
Simoen, Eddy
;
Mercha, Abdelkarim
;
Claeys, Cor
Issue
6
Journal
Semiconductor Science and Technology
Volume
18
Title
Recovery behaviour resulting from thermal annealing in n-MOSFETs irradiated by 20MeV protons
Publication type
Journal article
Embargo date
9999-12-31
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