Publication:
Recovery behaviour resulting from thermal annealing in n-MOSFETs irradiated by 20MeV protons
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1904 since deposited on 2021-10-15
3last month
Acq. date: 2026-05-16
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Views
1904 since deposited on 2021-10-15
3last month
Acq. date: 2026-05-16
Citations