Authors

Hayama, K.; Takakura, T.; Ohyama, H.; Kuboyama, S.; Matsuda, S.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor

Issue

9_11

Journal

Microelectronics Reliability

Volume

45

Title

Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs

Publication type

Journal article