Publication:
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs
Date
| dc.contributor.author | Hayama, K. | |
| dc.contributor.author | Takakura, T. | |
| dc.contributor.author | Ohyama, H. | |
| dc.contributor.author | Kuboyama, S. | |
| dc.contributor.author | Matsuda, S. | |
| dc.contributor.author | Rafi, J.M. | |
| dc.contributor.author | Mercha, Abdelkarim | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Mercha, Abdelkarim | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T01:56:10Z | |
| dc.date.available | 2021-10-16T01:56:10Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10554 | |
| dc.source.beginpage | 1376 | |
| dc.source.endpage | 1381 | |
| dc.source.issue | 9_11 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 45 | |
| dc.title | Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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