Publication:
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs
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1983 since deposited on 2021-10-16
3last month
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Acq. date: 2026-01-26
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1983 since deposited on 2021-10-16
3last month
1last week
Acq. date: 2026-01-26
Citations