Browsing by author "Lambrecht, Niels"
Now showing items 1-6 of 6
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A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test
Lambrecht, Niels; Pues, H.; De Zutter, Daniel; Vande Ginste, Dries (2018-08) -
Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
Lambrecht, Niels; De Zutter, Daniel; Vande Ginste, Dries; Pues, Hugo (2017-07) -
Machine learning based error detection in transient susceptibility tests
Medico, Roberto; Lambrecht, Niels; Pues, Hugo; Vande Ginste, Dries; Deschrijver, Dirk; Dhaene, Tom; Spina, Domenico (2019-04) -
Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices
Lambrecht, Niels; Pues, Hugo; De Zutter, Daniel; Vande Ginste, Dries (2017) -
Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Lambrecht, Niels; De Zutter, Daniel; Vande Ginste, Dries; Pues, Hugo (2017-09)