Authors

Lambrecht, Niels; De Zutter, Daniel; Vande Ginste, Dries; Pues, Hugo

Conference

11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits - EMCCompo

Title

Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits

Publication type

Proceedings paper

Embargo date

9999-12-31