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Conference contributions
Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
Publication:
Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
Date
2017-07
Proceedings Paper
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37194.pdf
561.19 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lambrecht, Niels
;
De Zutter, Daniel
;
Vande Ginste, Dries
;
Pues, Hugo
Journal
Abstract
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1904
since deposited on 2021-10-24
Acq. date: 2025-10-26
Citations
Metrics
Views
1904
since deposited on 2021-10-24
Acq. date: 2025-10-26
Citations