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Conference contributions
Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
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Circuit modeling of the ISO 10605 field coupled electrostatic discharge test to design robust automotive integrated circuits
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Date
2017-07
Proceedings Paper
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37194.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lambrecht, Niels
;
De Zutter, Daniel
;
Vande Ginste, Dries
;
Pues, Hugo
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Abstract
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1905
since deposited on 2021-10-24
Acq. date: 2025-12-14
Citations
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Views
1905
since deposited on 2021-10-24
Acq. date: 2025-12-14
Citations