Browsing by author "Roca, Elisenda"
Now showing items 1-9 of 9
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Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
Martin-Martinez, Javier; Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Rodriguez, Rosana; Castro-Lopez, Rafael; Roca, Elisenda; Fernandez, Francisco V.; Nafria, Montserrat (2023) -
CoSi2Si1-xGx-interfaces for Schottky barrier infrared detectors with extended detection regime
Kolodinski, Sabine; Alves Donaton, Ricardo; Roca, Elisenda; Caymax, Matty; Maex, Karen (1995) -
Electro-optical characterization of epitaxial and polycrystalline CoSi2 Schottky diodes
Roca, Elisenda; Larsen, Kim Kyllesbech; Kolodinski, Sabine; Mertens, Robert (1995) -
Increase in the infrared response of silicide schottky barrier diodes by grain boundary scattering
Roca, Elisenda; Kyllesbech Larsen, K.; Kolodinski, Sabine; Mertens, Robert (1995) -
Influence of grain boundary scattering in the infrared response of silicide Schottky barrier diodes
Roca, Elisenda; Larsen, Kim Kyllesbech; Kolodinski, Sabine; Mertens, Robert (1996) -
Infrared response of epitaxial and polycrystalline CoSi2 Schottky diodes
Roca, Elisenda; Larsen, Kim Kyllesbech; Kolodinski, Sabine; Mertens, Robert (1998) -
Non-destructive characterization of the uniformity of thin cobalt disilicide films by Raman microprobe measurements
Pérez-Rodríguez, A.; Roca, Elisenda; Jawhari, T.; Morante, J. R.; Schreutelkamp, Rob (1994) -
Non-destructive thickness determination of thin cobalt and cobalt disilicide layers on silicon substrates
Roca, Elisenda; Vanhellemont, Jan; Schreutelkamp, Rob; Vermeiren, Jan (1994) -
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Saraza-Canflanca, Pablo; Rodriguez, Rosana; Martin-Martinez, Javier; Castro-Lopez, Rafael; Roca, Elisenda; V. Fernandez, Fancisco; Nafria, Montserrat; Diaz Fortuny, Javier (2021)