Browsing by author "Penaud, J."
Now showing items 1-3 of 3
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Capacitance-voltage (CV) characterization of GaAs/high-k oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Merckling, Clement; Penaud, J.; Alian, AliReza; Sioncke, Sonja; Wang, Wei-E; Meuris, Marc; Caymax, Matty; Heyns, Marc (2008) -
Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
Merckling, Clement; Chang, Y.C.; Lu, C.Y.; Penaud, J.; Brammertz, Guy; Scarrozza, Marco; Pourtois, Geoffrey; Kwo, J.; Hong, M.; Dekoster, Johan; Meuris, Marc; Heyns, Marc; Caymax, Matty (2011) -
Interface properties improvement of Ge/Al2O3 and Ge/GeO2/Al2O3 gate stacks using molecular beam deposition
Bellenger, Florence; Merckling, Clement; Penaud, J.; Houssa, Michel; Caymax, Matty; Meuris, Marc; De Meyer, Kristin; Heyns, Marc (2008)