Authors

Merckling, Clement; Chang, Y.C.; Lu, C.Y.; Penaud, J.; Brammertz, Guy; Scarrozza, Marco; Pourtois, Geoffrey; Kwo, J.; Hong, M.; Dekoster, Johan; Meuris, Marc; Heyns, Marc; Caymax, Matty

ISSN

0039-6028

Issue

19_20

Journal

Surface Science

Volume

605

Title

Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation

Publication type

Journal article