Browsing by author "Sajavaara, T."
Now showing items 1-8 of 8
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Characterization of high and low dielectrica using low Energy Time of Flight Elastic Recoil Detection
Brijs, Bert; Sajavaara, T.; Giangrandi, Simone; Arstila, K. (2005) -
Considerations about multiple and plural scattering in heavy-ion low-energy ERDA
Giangrandi, Simone; Arstila, Kai; Brijs, Bert; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2009) -
Depth profiling of Al2O3 + TiO2 nanolaminates by means of a time-of-flight energy spectrometer
Laitinen, M.; Sajavaara, T.; Rossi, M.; Julin, J.; Puurunen, R.L.; Suni, T.; Ishida, T.; Fujita, H.; Brijs, Bert; Whitlow, H.J. (2011) -
Depth resolution optimization and role of multiple scattering in low-energy TOF-ERDA
Giangrandi, Simone; Brijs, Bert; Arstila, Kai; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Depth resolution optimization for low-energy ERDA
Giangrandi, Simone; Arstila, Kai; Brijs, Bert; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Growth and characterization of atomic layer deposited WCxNy
Martin Hoyas, Ana; Travaly, Youssef; Schuhmacher, Jorg; Sajavaara, T.; Whelan, Caroline; Eyckens, Brenda; Richard, Olivier; Giangrandi, Simone; Brijs, Bert; Jonas, A.M.; Vantomme, A.; Vandervorst, Wilfried; Celis, Jean-Pierre; Maex, Karen (2005) -
Potentialities and limitations of low-energy TOF-ERDA for high resolution and quantitative profiling of thin films
Giangrandi, Simone; Brijs, Bert; Arstial, K.; Sajavaara, T.; Vantomme, Andre; Vandervorst, Wilfried (2007) -
Time-of-flight telescope for heavy-ion RBS
Giangrandi, Simone; Brijs, Bert; Sajavaara, T.; Arstila, Kai; Vantomme, Andre; Vandervorst, Wilfried (2007)