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Potentialities and limitations of low-energy TOF-ERDA for high resolution and quantitative profiling of thin films
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Potentialities and limitations of low-energy TOF-ERDA for high resolution and quantitative profiling of thin films
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Giangrandi, Simone
;
Brijs, Bert
;
Arstial, K.
;
Sajavaara, T.
;
Vantomme, Andre
;
Vandervorst, Wilfried
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1937
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations
Metrics
Views
1937
since deposited on 2021-10-16
Acq. date: 2025-12-10
Citations