Browsing by author "Tack, M."
Now showing items 1-6 of 6
-
A comprehensive model for hot carrier degradation in LDMOS transistors
Moens, P.; Mertens, Jan; Bauwens, F.; Joris, P.; De Ceuninck, Ward; Tack, M. (2007) -
A high voltage p-type drain extended MOS in a low voltage sub-micron CMOS technology
Vermandel, Miguel; De Backere, Christof; Van Calster, Andre; Witters, Johan; Tack, M. (1998) -
Dynamic-ron control via proton irradiation in AlGaN/GaN transistors
Tajalli, A.; Stockman, Arno; Meneghini, M.; Mouhoubi, S.; Banerjee, A.; Gerardin, S.; Bagatin, M.; Paccagnella, A.; Zanoni, E.; Tack, M.; Bakeroot, Benoit; Moens, P.; Meneghesso, G. (2018) -
Future trends in intelligent interface technologies for 42V battery automotive applications
Moens, P.; Bolognesi, D.; Delobel, L.; Villanueva, D.; Reynders, K.; Lowe, A.; Van Herzeele, G.; Tack, M.; Bakeroot, Benoit (2002) -
Stress-induced mobility enhancement for integrated power transistors
Moens, Paul; Roig, J.; Clemente, Francesca; De Wolf, Ingrid; Desoete, B.; Bauwens, F.; Tack, M. (2007) -
μ-Raman validated stress-enhanced mobility in XtreMOS transistors
Moens, P.; Roig, J.; Meersman, J.; Baele, J.; Desoete, B.; Tack, M.; De Wolf, Ingrid (2008)